The AMCC has a range of microscopes available for your characterization needs. The TEM and SEM provide the ability to image objects from 5nm-5cm. If the material is sensitive to damage from the electron beams or 3D visualization is desired, then our AFM can provide these details. The AMCC also houses X-ray diffractometers to analyze crystal structures and light scattering instruments to study size distribution.
Instrument Status as of 3/28/2017