Scanning Electron Microscope/Focused Ion Beam


The SCIOS Dual-Beam Scanning Electron Microscope/ Focused Ion Beam is a powerful research tool which allows for high resolution imaging as well as sample sectioning. Some of the features include:

  • Imaging Detectors: In-lens (T1, T2), CBS/ABS (Backscatter), ETD (Secondary), STEM w/ HAADF
  • FIB milling with Gallium LMIS
  • Platinum Deposition
  • Easy-Lift Needle Manipulator for TEM lammelas
  • EDX Elemental Analysis to indentify which elements are present in the sample
  • EBSD for grain orientation mapping (3D available)
  • Nability E-Beam Lithography