NanoSurf Easyscan 2


nanoSurf easyScan 2 AFM

General Information

Equipment Name: nanoSurf easyScan 2 AFM

Location: 361 ERC

Max Wafer Size: 2”


System Information

General Description: An atomic force microscope can make nanometer scale resolution measurements of topography and several other properties of a sample.

Basic Module:

  • Imaging modes Static Force (Contact):  Const. Force (Topography), Const. Height (Deflection)
  • Spectroscopy modes:  Force-Distance, Force-Tip voltage

Dynamic Module:

  • Additional imaging modes: Dynamic Force (Intermittent Contact, etc.): Const. Amplitude (Topography), Const. Height (Amplitude)
  • Additional spectroscopy modes:  Amplitude-Distance used to investigate sample surfaces.


  • Typical resolution 3-10nm
  • Max x-y range 70 micron
  • Max z range 14 micron

Acceptable materials are any dry sample. No fluids are allowed on this system.


Useful System Links

Equipment Use Fees

Internal $30/hour External $60/hour
Staff time: $80/hour

Schedule Training 


Operators Manual