Equipment

The AMCC has a range of microscopes available for your characterization needs. The TEM and SEM provide the ability to image objects from 5nm-5cm.  If the material is sensitive to damage from the electron beams or 3D visualization is desired, then our AFM can provide these details. The AMCC also houses X-ray diffractometers to analyze crystal structures and light scattering instruments to study size distribution.

The SCIOS Dual-Beam Scanning Electron Microscope/ Focused Ion Beam is a powerful research tool which allows for high resolution imaging as well as sample sectioning. Some of the features include:

• Imaging Detectors: In-lens (T1, T2), CBS/ABS (Backscatter), ETD (Secondary), STEM w/ HAADF
  
• FIB milling with Gallium LMIS
• Platinum Deposition
• Easy-Lift Needle Manipulator for TEM lammelas
  
• EDX Elemental Analysis to indentify which elements are present in the sample
  
• EBSD for grain orientation mapping (3D available)
  
• Nability E-Beam Lithography

The FEI Apreo provides high resolution imaging for both conductive and non-conductive samples (in Low-Vac mode). The Apreo is equipted with an EDAX elemental analysis detector to provide compositional information of samples.

The CM-20 TEM provides sub-nanometer resolution for samples with a thickness less than 1 micron.

• Includes EDX Elemental Analysis
• Orius CCD
• Lab6 200Kv electron gun
• Single and Double Tilt sample holders

Atomic Force microscopy is an imaging and surface probing technique, used to determine sample roughness, suface imaging and force spectroscopy via nano-indentation. 3D imaging is possible for samples with sample height variations of less than 4 microns.

For an introduction to Scanning Probe Microscopy, consult the SPM notebook.

• Up to 200 mm diameter and 12 mm thick
  

• Tapping
• Contact AFM

• Tube type: Cu with long line focus (wavelength = 1.54056 A)
• Jade analysis suite with ICDD PDF 4 database
• Normal Operating Power 45kV, 40mA

MDI’s Jade is a full quantification program for X-Ray Diffraction data. Access over 300,000 known phases in the accompanying ICDD diffraction database to correctly identify unknown material.  Utilize the built-in whole pattern fitting functionality to quantify compound components, observe and manipulate data with ease, and prepare reports with a variety of graphical options.

• Temp range: RT-800C

• Temp range: -90-550C
• Modulated DSC available

TA Instruments DHR 20 Rheometer with DMA capabilities