Advanced Materials Characterization Center
The Advanced Materials Characterization Center is a core facility within the College of Engineering and Applied Science focusing primarily on Electron Microscopy and X-ray Diffractometry. We work with both internal and external clients on a wide range of sample types.
Mon-Friday from 9am-5pm.
The center follows the university's holiday and inclement weather closure policy. (Individual equipment hours may vary.)
The AMCC is located on the 3rd floor within the Engineering Research Center at UC's Main Campus. Parking is available in both Woodside Garage and the Campus Green Garage.
Schedule Time in the Lab
Use the lab calendar system to choose a time frame to utilize the equipment in the AMCC lab.
The AMCC has a range of microscopes available for your characterization needs. The TEM and SEM provide the ability to image objects from 5nm-5cm. The AMCC also houses X-ray diffractometers to analyze crystal structures and thermal analysis equipment to study size distribution.
Scanning Electron Microscope/Focused Ion Beam
The SCIOS Dual-Beam Scanning Electron Microscope/ Focused Ion Beam is a powerful research tool which allows for high resolution imaging as well as sample sectioning. Some of the features include:
- Imaging Detectors: In-lens (T1, T2), CBS/ABS (Backscatter), ETD (Secondary), STEM w/ HAADF
- FIB milling with Gallium LMIS
- Platinum Deposition
- Easy-Lift Needle Manipulator for TEM lammelas
- EDX Elemental Analysis to indentify which elements are present in the sample
- EBSD for grain orientation mapping (3D available)
- Nability E-Beam Lithography
Scanning Electron Microscope (Low-Vac)
The FEI Apreo provides high resolution imaging for both conductive and non-conductive samples (in Low-Vac mode). The Apreo is equipted with an EDAX elemental analysis detector to provide compositional information of samples.
Transmission Electron Microscope
Talos F200i (Thermofisher)
- 200Kv Field Emission gun
- STEM
- HAADF
- EDS
X-Ray Diffractometer: Rigaku Smartlab XRD
- Tube type: Cu with long line focus (wavelength = 1.54056 A)
- Jade analysis suite with ICDD PDF 4 database
- Normal Operating Power 45kV, 40mA
X-Ray Diffractometer: Analysis Software
MDI’s Jade is a full quantification program for X-Ray Diffraction data. Access over 300,000 known phases in the accompanying ICDD diffraction database to correctly identify unknown material. Utilize the built-in whole pattern fitting functionality to quantify compound components, observe and manipulate data with ease, and prepare reports with a variety of graphical options.
Thermal Analysis
TGA 550 (TA Instruments)
- Temp range: RT-800C
DSC D2500 (TA Instruments)
- Temp range: -90-550C
- Modulated DSC available
Rheometer HR-20 (TA Instruments)
- DMA attachment available
External Clients
We offer very competitive external rates for assisted and unassisted use of the instruments. For more information, please contact Dr. Melodie Fickenscher at fickenm@ucmail.uc.edu.
Internal (UC) Clients
| Instrument | Internal Rate (per hour) unassisted |
Internal Rate (per hour) assisted |
|---|---|---|
| SCIOS SEM/FIB |
$50 | $100 |
| FIB gasses surcharge |
$15 | $15 |
| Apreo SEM | $50 | $100 |
| TEM |
$45 | $90 |
| XRD |
$30 |
$60 |
| DSC, TGA, Rheometer | $30 |
$60 |
| Hazardous Materials/ Special Assistance |
- | $50 |
| Sample Preparation |
- | $30 |
In the News
Technology at UC's Advanced Materials Characterization Center enables scientists to study the smallest objects.
Contact Us
For questions about the center or for instrument training, please contact us!
Melodie A Fickenscher
Research Associate, CEAS - Characterization Center
314 MANTEI